Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15mum Channel-Length N-MOSFETs

A. Bravaix, D. Goguenheim, N. Revil, E. Vincent. Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15mum Channel-Length N-MOSFETs. Microelectronics Reliability, 41(9-10):1313-1318, 2001.

Abstract

Abstract is missing.