Alain Bravaix, Edith Kussener, David Ney, Xavier Federspiel, Florian Cacho. Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-8, IEEE, 2020. [doi]
Abstract is missing.