Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
A. Bravaix, C. Trapes, D. Goguenheim, N. Revil, E. Vincent. Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies. Microelectronics Reliability, 43(8):1241-1246, 2003. [doi]
Abstract is missing.