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Giovanni Breglio, Andrea Irace, E. Napoli, M. Riccio, Paolo Spirito, K. Hamada, T. Nishijima, T. Ueta. Detection of localized UIS failure on IGBTs with the aid of lock-in thermography. Microelectronics Reliability, 48(8-9):1432-1434, 2008. [doi]