Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell

Giovanni Breglio, Andrea Irace, E. Napoli, Paolo Spirito, K. Hamada, T. Nishijima, T. Ueta. Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. Microelectronics Reliability, 47(9-11):1756-1760, 2007. [doi]

Abstract

Abstract is missing.