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Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell

Giovanni Breglio, Andrea Irace, E. Napoli, Paolo Spirito, K. Hamada, T. Nishijima, T. Ueta. Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. Microelectronics Reliability, 47(9-11):1756-1760, 2007. [doi]

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Giovanni Breglio

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Andrea Irace

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E. Napoli

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Paolo Spirito

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K. Hamada

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T. Nishijima

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T. Ueta

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