Extensive Laser Fault Injection Profiling of 65 nm FPGA

Jakub Breier, Wei He, Shivam Bhasin, Dirmanto Jap, Samuel Chef, Hock Guan Ong, Chee Lip Gan. Extensive Laser Fault Injection Profiling of 65 nm FPGA. J. Hardware and Systems Security, 1(3):237-251, 2017. [doi]

Authors

Jakub Breier

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Wei He

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Shivam Bhasin

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Dirmanto Jap

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Samuel Chef

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Hock Guan Ong

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Chee Lip Gan

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