Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller - researchr publication authors

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Jakub Breier, Dirmanto Jap. Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller. In Stavros Koubias, Thilo Sauter, editors, Proceedings of the 10th Workshop on Embedded Systems Security, WESS 2015, Amsterdam, The Netherlands, October 8, 2015. pages 5, ACM, 2015. [doi]

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