Franc Brglez, David Bryan, John D. Calhoun, Robert Lisanke. A modular scan-based testability system. In Computer Design: VLSI in Computers and Processors, ICCD 1988., Proceedings of the 1988 IEEE International Conference on, Rye Brook, NY, USA, October 3-5, 1988. pages 408-412, IEEE, 1988. [doi]
Abstract is missing.