Factorized Test Generation for Multi-Input/Output Transition Systems

Ed Brinksma, Lex Heerink, Jan Tretmans. Factorized Test Generation for Multi-Input/Output Transition Systems. In Alexandre Petrenko, Nina Yevtushenko, editors, Testing of Communicating Systems, IFIP TC6 11th International Workshop on Testing Communicating Systems (IWTCS), August 31 - September 2, 1998, Tomsk, Russia. Volume 131 of IFIP Conference Proceedings, pages 67-82, Kluwer, 1998.

Authors

Ed Brinksma

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Lex Heerink

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Jan Tretmans

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