Factorized Test Generation for Multi-Input/Output Transition Systems

Ed Brinksma, Lex Heerink, Jan Tretmans. Factorized Test Generation for Multi-Input/Output Transition Systems. In Alexandre Petrenko, Nina Yevtushenko, editors, Testing of Communicating Systems, IFIP TC6 11th International Workshop on Testing Communicating Systems (IWTCS), August 31 - September 2, 1998, Tomsk, Russia. Volume 131 of IFIP Conference Proceedings, pages 67-82, Kluwer, 1998.

@inproceedings{BrinksmaHT98,
  title = {Factorized Test Generation for Multi-Input/Output Transition Systems},
  author = {Ed Brinksma and Lex Heerink and Jan Tretmans},
  year = {1998},
  tags = {testing},
  researchr = {https://researchr.org/publication/BrinksmaHT98},
  cites = {0},
  citedby = {0},
  pages = {67-82},
  booktitle = {Testing of Communicating Systems, IFIP TC6 11th International Workshop on Testing Communicating Systems (IWTCS), August 31 - September 2, 1998, Tomsk, Russia},
  editor = {Alexandre Petrenko and Nina Yevtushenko},
  volume = {131},
  series = {IFIP Conference Proceedings},
  publisher = {Kluwer},
  isbn = {0-412-84430-3},
}