Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells

Melanie Brocard, Benoît Mathieu, Jean-Philippe Colonna, Cristiano Santos, Claire Fenouillet-Béranger, Cao-Minh Vincent Lu, Gerald Cibrario, Laurent Brunet, Perrine Batude, François Andrieu, Sebastien Thuries, Olivier Billoint. Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 539-544, IEEE, 2017. [doi]

Authors

Melanie Brocard

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Benoît Mathieu

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Jean-Philippe Colonna

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Cristiano Santos

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Claire Fenouillet-Béranger

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Cao-Minh Vincent Lu

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Gerald Cibrario

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Laurent Brunet

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Perrine Batude

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François Andrieu

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Sebastien Thuries

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Olivier Billoint

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