Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells

Melanie Brocard, Benoît Mathieu, Jean-Philippe Colonna, Cristiano Santos, Claire Fenouillet-Béranger, Cao-Minh Vincent Lu, Gerald Cibrario, Laurent Brunet, Perrine Batude, François Andrieu, Sebastien Thuries, Olivier Billoint. Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 539-544, IEEE, 2017. [doi]

@inproceedings{BrocardMCSFLCBB17,
  title = {Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells},
  author = {Melanie Brocard and Benoît Mathieu and Jean-Philippe Colonna and Cristiano Santos and Claire Fenouillet-Béranger and Cao-Minh Vincent Lu and Gerald Cibrario and Laurent Brunet and Perrine Batude and François Andrieu and Sebastien Thuries and Olivier Billoint},
  year = {2017},
  doi = {10.1109/ISVLSI.2017.100},
  url = {https://doi.org/10.1109/ISVLSI.2017.100},
  researchr = {https://researchr.org/publication/BrocardMCSFLCBB17},
  cites = {0},
  citedby = {0},
  pages = {539-544},
  booktitle = {2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017},
  publisher = {IEEE},
  isbn = {978-1-5090-6762-6},
}