Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo Reis. Statistical and Numerical Approach for a Computer efficient circuit yield analysis. In VLSI-SoC: Advanced Topics on Systems on a Chip - A Selection of Extended Versions of the Best Papers of the Fourteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC2007), October 15-17, 2007, Atlanta, USA. Volume 291 of IFIP, pages 1-24, Springer, 2007. [doi]
Abstract is missing.