S. Bruyère, F. Monsieur, D. Roy, E. Vincent, G. Ghibaudo. Failures in ultrathin oxides: Stored energy or carrier energy driven?. Microelectronics Reliability, 41(9-10):1367-1372, 2001.
@article{BruyereMRVG01,
title = {Failures in ultrathin oxides: Stored energy or carrier energy driven?},
author = {S. Bruyère and F. Monsieur and D. Roy and E. Vincent and G. Ghibaudo},
year = {2001},
tags = {e-science},
researchr = {https://researchr.org/publication/BruyereMRVG01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {9-10},
pages = {1367-1372},
}