Failures in ultrathin oxides: Stored energy or carrier energy driven?

S. Bruyère, F. Monsieur, D. Roy, E. Vincent, G. Ghibaudo. Failures in ultrathin oxides: Stored energy or carrier energy driven?. Microelectronics Reliability, 41(9-10):1367-1372, 2001.

@article{BruyereMRVG01,
  title = {Failures in ultrathin oxides: Stored energy or carrier energy driven?},
  author = {S. Bruyère and F. Monsieur and D. Roy and E. Vincent and G. Ghibaudo},
  year = {2001},
  tags = {e-science},
  researchr = {https://researchr.org/publication/BruyereMRVG01},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {41},
  number = {9-10},
  pages = {1367-1372},
}