Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI

Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Mario Jino. Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI. In Jürgen Münch, Matias Vierimaa, editors, Product-Focused Software Process Improvement, 7th International Conference, PROFES 2006, Amsterdam, The Netherlands, June 12-14, 2006, Proceedings. Volume 4034 of Lecture Notes in Computer Science, pages 263-277, Springer, 2006. [doi]

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