Ileana Buhan, Asker M. Bazen, Pieter H. Hartel, Raymond N. J. Veldhuis. A False Rejection Oriented Threat Model for the Design of Biometric Authentication Systems. In David Zhang, Anil K. Jain, editors, Advances in Biometrics, International Conference, ICB 2006, Hong Kong, China, January 5-7, 2006, Proceedings. Volume 3832 of Lecture Notes in Computer Science, pages 728-736, Springer, 2006. [doi]
Abstract is missing.