Investigations for minimum invasion digital only built-in "ramp" based test techniques for charge pump PLL's

Martin John Burbidge, Frédéric Poullet, Jim Tijou, Andrew M. D. Richardson. Investigations for minimum invasion digital only built-in "ramp" based test techniques for charge pump PLL's. In 7th European Test Workshop, ETW 2002, Corfu, Greece, May 26-29, 2002. pages 95-102, IEEE Computer Society, 2002. [doi]

Abstract

Abstract is missing.