WISE: Automated test generation for worst-case complexity

Jacob Burnim, Sudeep Juvekar, Koushik Sen. WISE: Automated test generation for worst-case complexity. In 31st International Conference on Software Engineering, ICSE 2009, May 16-24, 2009, Vancouver, Canada, Proceedings. pages 463-473, IEEE, 2009. [doi]

Abstract

Abstract is missing.