Automatic lateral resonance identification from cantilever deflection information in high speed atomic force microscopy

Daniel J. Burns, Georg Ernest Fantner, Kamal Youcef-Toumi. Automatic lateral resonance identification from cantilever deflection information in high speed atomic force microscopy. In American Control Conference, ACC 2012, Montreal, QC, Canada, June 27-29, 2012. pages 3240-3246, IEEE, 2012. [doi]

Abstract

Abstract is missing.