Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner. Characterization of photonic devices by secondary electron potential contrast. Microelectronics Reliability, 46(9-11):1536-1541, 2006. [doi]
@article{BuzzoCF06,
title = {Characterization of photonic devices by secondary electron potential contrast},
author = {Marco Buzzo and Mauro Ciappa and Wolfgang Fichtner},
year = {2006},
doi = {10.1016/j.microrel.2006.07.016},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.016},
researchr = {https://researchr.org/publication/BuzzoCF06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1536-1541},
}