Marco Buzzo, Markus Leicht, Thomas Schweinböck, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner. +N Junction by Scanning Capacitance and Scanning Electron Microscopy. Microelectronics Reliability, 44(9-11):1681-1686, 2004. [doi]
@article{BuzzoLSCSF04,
title = {+N Junction by Scanning Capacitance and Scanning Electron Microscopy},
author = {Marco Buzzo and Markus Leicht and Thomas Schweinböck and Mauro Ciappa and Maria Stangoni and Wolfgang Fichtner},
year = {2004},
doi = {10.1016/j.microrel.2004.07.053},
url = {http://dx.doi.org/10.1016/j.microrel.2004.07.053},
researchr = {https://researchr.org/publication/BuzzoLSCSF04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {9-11},
pages = {1681-1686},
}