Scrgey Bychikhin, T. Swietlik, T. Suski, S. Porowski, P. Perlin, Dionyz Pogany. Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping. Microelectronics Reliability, 47(9-11):1649-1652, 2007. [doi]
Abstract is missing.