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Low-Complexity Dynamic Channel Scaling of Noise-Resilient CNN for Intelligent Edge Devices

Younghoon Byun, Minho Ha, Jeonghun Kim, Sunggu Lee, Youngjoo Lee. Low-Complexity Dynamic Channel Scaling of Noise-Resilient CNN for Intelligent Edge Devices. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 114-119, IEEE, 2019. [doi]

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