A Kernel Based Learning by Sample Technique for Defect Identification Through the Inversion of a Typical Electric Problem

Matteo Cacciola, Maurizio Campolo, Fabio La Foresta, Francesco Carlo Morabito, Mario Versaci. A Kernel Based Learning by Sample Technique for Defect Identification Through the Inversion of a Typical Electric Problem. In Bruno Apolloni, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based Intelligent Information and Engineering Systems, 11th International Conference, KES 2007, XVII Italian Workshop on Neural Networks, Vietri sul Mare, Italy, September 12-14, 2007, Proceedings, Part III. Volume 4694 of Lecture Notes in Computer Science, pages 243-250, Springer, 2007. [doi]

Abstract

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