A catalogue of stub and driver patterns to support integration testing of aspect-oriented programs

Bruno Barbieri Pontes Cafeo, Reginaldo Ré, Rosana Teresinha Vaccare Braga, Paulo César Masiero. A catalogue of stub and driver patterns to support integration testing of aspect-oriented programs. In Rebecca Wirfs-Brock, Uirá Kulesza, editors, Proceedings of the 8th Latin American Conference on Pattern Languages of Programs, SugarLoafPLoP 2010, Salvador, Bahia, Brazil, September 23-27, 2010. ACM, 2010. [doi]

Abstract

Abstract is missing.