Bora Caglayan, Ayse Tosun Misirli, Gul Calikli, Ayse Bener, Turgay Aytac, Burak Turhan. Dione: an integrated measurement and defect prediction solution. In Will Tracz, Martin P. Robillard, Tevfik Bultan, editors, 20th ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE-20), SIGSOFT/FSE'12, Cary, NC, USA - November 11 - 16, 2012. pages 20, ACM, 2012. [doi]
Abstract is missing.