Yi Cai, Amit Bhattacharyya, Joe Martone, Anant Verma, William Burchanowski. A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 8, IEEE, 2005. [doi]
Abstract is missing.