Yu Cai, Yixin Luo, Erich F. Haratsch, Ken Mai, Onur Mutlu. Data retention in MLC NAND flash memory: Characterization, optimization, and recovery. In 21st IEEE International Symposium on High Performance Computer Architecture, HPCA 2015, Burlingame, CA, USA, February 7-11, 2015. pages 551-563, IEEE, 2015. [doi]
Abstract is missing.