Chang Cai, Tianqi Liu, Jie Liu 0032, Gengsheng Chen, Luchang Ding, Kai Zhao, Bingxu Ning, Mingjie Shen. Large-tilt Heavy Ions Induced SEU in Multiple Radiation Hardened 22 nm FDSOI SRAMs. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.