Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski. Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 319-324, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.