TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm Bulk-CMOS Technologies

Ramon Canal, Antonio Rubio, A. Asenov, A. Brown, Miguel Miranda, Paul Zuber, Antonio González, Xavier Vera. TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm Bulk-CMOS Technologies. Procedia CS, 7:148-149, 2011. [doi]

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