Yuan Cao, Haibo He. Learning from testing data: A new view of incremental semi-supervised learning. In Proceedings of the International Joint Conference on Neural Networks, IJCNN 2008, part of the IEEE World Congress on Computational Intelligence, WCCI 2008, Hong Kong, China, June 1-6, 2008. pages 2872-2878, IEEE, 2008. [doi]
Abstract is missing.