MOSFET modeling for 45nm and beyond

Yu Cao, Colin C. McAndrew. MOSFET modeling for 45nm and beyond. In Georges G. E. Gielen, editor, 2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA. pages 638-643, IEEE, 2007. [doi]

Abstract

Abstract is missing.