Gian-Carlo Cardarilli, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano. Data Integrity Evaluations of Reed Solomon Codes for Storage Systems. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 158-164, IEEE Computer Society, 2004. [doi]
Abstract is missing.