Clemente Cárdenas, Javier Olmos, David García, Enrique Baeyens. Modelling, supervision and diagnosis of a manufacturing cell. In Proceedings of 9th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2003, September 16-19, 2003, Lisbon, Portugal - Volume 1. pages 69-74, IEEE, 2003. [doi]
Abstract is missing.