Joan Carletta, Christos A. Papachristou. Testability analysis and insertion for RTL circuits based on pseudorandom BIST. In 1995 International Conference on Computer Design (ICCD 95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings. pages 162-167, IEEE Computer Society, 1995. [doi]
Abstract is missing.