System Level Testing via TLM 2.0 Debug Transport Interface

Stefano Di Carlo, Nadereh Hatami, Paolo Prinetto, Alessandro Savino. System Level Testing via TLM 2.0 Debug Transport Interface. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 286-294, IEEE Computer Society, 2009. [doi]

Abstract

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