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SiC power MOSFETs performance, robustness and technology maturity

Alberto Castellazzi, Asad Fayyaz, G. Romano, Li Yang, Michele Riccio, Andrea Irace. SiC power MOSFETs performance, robustness and technology maturity. Microelectronics Reliability, 58:164-176, 2016. [doi]

Authors

Alberto Castellazzi

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Asad Fayyaz

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G. Romano

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Li Yang

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Michele Riccio

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Andrea Irace

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