A robust method to identify faults in correlated sensors in machine condition monitoring

Zehra Cataltepe, Chao Yuan, Claus Neubauer, Meltem Demirkus, Hans-Gerd Brummel. A robust method to identify faults in correlated sensors in machine condition monitoring. In 13th European Signal Processing Conference, EUSIPCO 2005, Antalya, Turkey, September 4-8, 2005. pages 1-4, IEEE, 2005. [doi]

Abstract

Abstract is missing.