Identifying the most valuable developers using artifact traceability graphs

H. Alperen Cetin. Identifying the most valuable developers using artifact traceability graphs. In Marlon Dumas, Dietmar Pfahl, Sven Apel, Alessandra Russo, editors, Proceedings of the ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/SIGSOFT FSE 2019, Tallinn, Estonia, August 26-30, 2019. pages 1196-1198, ACM, 2019. [doi]

Abstract

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