Sang-uhn Cha, Seongil O, Hyunsung Shin, Sangjoon Hwang, Kwang-Il Park, Seong-Jin Jang, Joo-Sun Choi, Gyo-Young Jin, Young Hoon Son, Hyunyoon Cho, Jung Ho Ahn, Nam Sung Kim. Defect Analysis and Cost-Effective Resilience Architecture for Future DRAM Devices. In 2017 IEEE International Symposium on High Performance Computer Architecture, HPCA 2017, Austin, TX, USA, February 4-8, 2017. pages 61-72, IEEE Computer Society, 2017. [doi]
Abstract is missing.