Low-power design under variation using error prevention and error tolerance (invited paper)

Kwanyeob Chae, Minki Cho, Saibal Mukhopadhyay. Low-power design under variation using error prevention and error tolerance (invited paper). In 13th Latin American Test Workshop, LATW 2012, Quito, Ecuador, April 10-13, 2012. pages 1-6, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.