Error resilient logic circuits under dynamic variations

Kwanyeob Chae, Saibal Mukhopadhyay. Error resilient logic circuits under dynamic variations. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 250, IEEE, 2013. [doi]

Abstract

Abstract is missing.