DDQ tests for bridging faults in combinational circuits

Sreejit Chakravarty, Paul J. Thadikaran. DDQ tests for bridging faults in combinational circuits. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 25-32, IEEE, 1993. [doi]

Abstract

Abstract is missing.