The impact of NMOSFET hot-carrier degradation on CMOS analog subcircuit performance

Vei-Han Chan, James E. Chung. The impact of NMOSFET hot-carrier degradation on CMOS analog subcircuit performance. J. Solid-State Circuits, 30(6):644-649, June 1995. [doi]

@article{ChanC95-2,
  title = {The impact of NMOSFET hot-carrier degradation on CMOS analog subcircuit performance},
  author = {Vei-Han Chan and James E. Chung},
  year = {1995},
  month = {June},
  doi = {10.1109/4.387067},
  url = {https://doi.org/10.1109/4.387067},
  researchr = {https://researchr.org/publication/ChanC95-2},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {30},
  number = {6},
  pages = {644-649},
}