A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line

Antonio H. Chan, Gordon W. Roberts. A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 858-867, IEEE Computer Society, 2001.

Abstract

Abstract is missing.