Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction

Anshuman Chandra, Felix Ng, Rohit Kapur. Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 462-467, 2008. [doi]

Abstract

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