Kameshwar Chandrasekar, Surendra Bommu, Sanjay Sengupta. Low Coverage Analysis using dynamic un-testability debug in ATPG. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 291-296, IEEE Computer Society, 2011. [doi]
Abstract is missing.