Jyh-Yeong Chang, Wei-Lun Chang. Similarity based ART 1 model for automatic die defect detection and classification. In 2014 Joint 7th International Conference on Soft Computing and Intelligent Systems (SCIS) and 15th International Symposium on Advanced Intelligent Systems (ISIS), Kita-Kyushu, Japan, December 3-6, 2014. pages 883-887, IEEE, 2014. [doi]
Abstract is missing.